Published June 1998
| Version v1
Journal article
Comparison of total dose responses on high resolution analog-to-digital converter technologies
Creators
- 1. California Inst. of Tech., Pasadena, CA (United States). Jet Propulsion Lab.
Description
Two different 12-bit analog-to-digital converter technologies, CMOS and BiCMOS, from Burr-Brown were compared for total dose responses. The BiCMOS converter appears to be a better candidate for space applications. CMOS devices showed larger degradation with both high dose rate (HDR) and low dose rate (LDR). An external voltage reference can be used for a radiation hardened process 12-bit converter from Analog Devices to maintain accuracy up to 1 Mrad(Si). DATEL's 16-bit hybrid converter showed a low failure level with HDR
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 45
- Journal Issue
- 3Pt3
- Journal Page Range
- p. 1444-1449
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- radiations and their effects on devices and systems conference
- Acronym
- RADECS 97
- Dates
- 15-19 Sep 1997
- Place
- Cannes (France)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 29060920
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; COMPARATIVE EVALUATIONS; FAILURES; PHYSICAL RADIATION EFFECTS; RADIATION DOSES
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; RADIATION EFFECTS
Optional Information
- Secondary number(s)
- CONF-970934--