Published September 12, 2011 | Version v1
Journal article

Escape process and stochastic resonance under noise intensity fluctuation

  • 1. Department of Biophysics and Biochemistry, Graduate School of Science, The University of Tokyo, Tokyo 113-0033 (Japan)
  • 2. Institute for Advanced Biosciences, Keio University, Yamagata 997-0035 (Japan)

Description

We study the effects of noise intensity fluctuations on the stationary and dynamical properties of an overdamped Langevin model with a bistable potential and external periodical driving force. We calculated the stationary distributions, mean-first passage time (MFPT) and the spectral amplification factor using a complete set expansion (CSE) technique. We found resonant activation (RA) and stochastic resonance (SR) phenomena in the system under investigation. Moreover, the strength of RA and SR phenomena exhibit non-monotonic behavior and their trade-off relation as a function of the squared variation coefficient of the noise intensity process. The reliability of CSE is verified with Monte Carlo simulations. -- Highlights: → Systems under noise intensity fluctuations are studied. → Stationary distributions, mean-first passage time and stochastic resonance are calculated. → We find the resonant phenomena in terms of variation coefficient of the noise intensity process.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2011.07.054

Additional details

Identifiers

DOI
10.1016/j.physleta.2011.07.054;
arXiv
arXiv:1011.2533v4;
PII
S0375-9601(11)00940-6;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
375
Journal Issue
39
Journal Page Range
p. 3450-3458
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45056136
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
AMPLIFICATION; COMPUTERIZED SIMULATION; DISTRIBUTION; FLUCTUATIONS; FUNCTIONS; MONTE CARLO METHOD; NOISE; PERIODICITY; POTENTIALS; RELIABILITY; RESONANCE; STOCHASTIC PROCESSES
Descriptors DEC
CALCULATION METHODS; SIMULATION; VARIATIONS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.