Published 2010
| Version v1
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Sputtering and surface smoothing of Bi thin films deposited onto Si substrates under oblique impacts of 120 keV Ar+ ions
- 1. CRNA, B.P. 399, 02 Bd. Frantz Fanon, Alger-Gare, Algiers (Algeria)
- 2. USTHB, Faculty of Physics, B.P. 32, El-Alia, 16111 Bab Ezzouar, Algiers (Algeria)
- 3. iThemba Labs, MRG, P.O. Box 722, Somerset West, 7129 (South Africa)
Description
no abstract available
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42072970.pdf
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Additional details
Publishing Information
- Imprint Title
- 24. International Conference on Atomic Collisions in Solids ICACS-24
- Imprint Pagination
- 174 p.
- Journal Page Range
- p. Th-P42
- Report number
- INIS-PL--2011-0002
Conference
- Title
- 24. International Conference on Atomic Collisions in Solids
- Acronym
- ICACS-24
- Dates
- 18-23 Jul 2010
- Place
- Cracow (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 42072970
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ARGON IONS; ATOMIC FORCE MICROSCOPY; BISMUTH; CRYSTAL STRUCTURE; EXTERNAL IRRADIATION; SILICON; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FILMS; IONS; IRRADIATION; METALS; MICROSCOPY; SCATTERING; SEMIMETALS
Optional Information
- Notes
- 5 refs.