Published 2010
| Version v1
Book
Determination of the thickness of silicon ΔE-detectors
- 1. National Research Nuclear Univ. MEPhI, Moscow (Russian Federation)
Description
no abstract available
Additional details
Publishing Information
- Publisher
- SPbGU
- Imprint Place
- Sankt-Peterburg (Russian Federation)
- ISBN
- 978-5-98340-240-9
- Imprint Title
- LX International conference on nuclear physics NUCLEUS 2010. Methods of nuclear physics for femto- and nanotechnologies. Book of abstracts
- Imprint Pagination
- 446 p.
- Journal Page Range
- p. 353
Conference
- Title
- 60. International conference on nuclear physics
- Acronym
- NUCLEUS 2010
- Dates
- 6-9 Jul 2010
- Place
- Saint-Petersburg (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 44079694
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Numerical Data
- Descriptors DEI
- ALPHA DETECTION; ENERGY LOSSES; ENERGY RESOLUTION; EXPERIMENTAL DATA; PARTICLE IDENTIFICATION; SI SEMICONDUCTOR DETECTORS; THICKNESS
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DATA; DETECTION; DIMENSIONS; INFORMATION; LOSSES; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS