Published September 28, 2000 | Version v1
Report Metadata-only

Beam test results for the BTeV silicon pixel detector

Creators

Description

The authors report the results of the BTeV silicon pixel detector tests carried out in the MTest beam at Fermilab in 1999--2000. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold

Availability note (English)

Available from PURL: https://www.osti.gov/servlets/purl/764083-g1OCGR/webviewable/

Additional details

Identifiers

URL
https://www.osti.gov/servlets/purl/764083-g1OCGR/webviewable/;

Publishing Information

Imprint Pagination
85 Kilobytes
Report number
FERMILAB-Conf--00/227-E

Conference

Title
30. international conference on high energy physics
Acronym
ICHEP 2000
Dates
27 Jul - 2 Aug 2000
Place
Osaka (Japan)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
31060361
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
FERMILAB; PARTICLE BEAMS; PARTICLE TRACKS; PERFORMANCE TESTING; RADIATION DETECTORS; SPATIAL RESOLUTION
Descriptors DEC
BEAMS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; RESOLUTION; TESTING; US DOE; US ORGANIZATIONS

Optional Information

Contract/Grant/Project number
AC02-76CH03000
Funding organization
USDOE Office of Energy Research (ER) (United States)