Published April 15, 2009 | Version v1
Journal article

Method to determine the sticking coefficient of precursor molecules in atomic layer deposition

  • 1. Fraunhofer IKTS, 01277 Dresden (Germany)
  • 2. Department of Electrical Engineering and Information Technology, IHM, Technische Universitaet Dresden, 01062 Dresden (Germany)

Description

A method to determine the sticking coefficient of precursor molecules used in atomic layer deposition (ALD) will be introduced. The sticking coefficient is an interesting quantity for comparing different ALD processes and reactors but it cannot be observed easily. The method relies on free molecular flow in nanoscale cylindrical holes. The sticking coefficient is determined for tetrakis(dimethylamino)titanium in combination with ozone. The proposed method can be applied independent of the type of reactor, precursor delivery system and precursors.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2009.02.055

Additional details

Identifiers

DOI
10.1016/j.apsusc.2009.02.055;
PII
S0169-4332(09)00205-0;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
255
Journal Issue
13-14
Journal Page Range
p. 6620-6623
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44009303
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CHEMISTRY; CYLINDRICAL CONFIGURATION; DELIVERY; DEPOSITION; HOLES; LAYERS; MOLECULES; NANOSTRUCTURES; OZONE; PRECURSOR; SIMULATION; SURFACES; TITANIUM
Descriptors DEC
CONFIGURATION; ELEMENTS; METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.