Published April 15, 2009
| Version v1
Journal article
Method to determine the sticking coefficient of precursor molecules in atomic layer deposition
Creators
- 1. Fraunhofer IKTS, 01277 Dresden (Germany)
- 2. Department of Electrical Engineering and Information Technology, IHM, Technische Universitaet Dresden, 01062 Dresden (Germany)
Description
A method to determine the sticking coefficient of precursor molecules used in atomic layer deposition (ALD) will be introduced. The sticking coefficient is an interesting quantity for comparing different ALD processes and reactors but it cannot be observed easily. The method relies on free molecular flow in nanoscale cylindrical holes. The sticking coefficient is determined for tetrakis(dimethylamino)titanium in combination with ozone. The proposed method can be applied independent of the type of reactor, precursor delivery system and precursors.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.02.055Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.02.055;
- PII
- S0169-4332(09)00205-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 13-14
- Journal Page Range
- p. 6620-6623
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44009303
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHEMISTRY; CYLINDRICAL CONFIGURATION; DELIVERY; DEPOSITION; HOLES; LAYERS; MOLECULES; NANOSTRUCTURES; OZONE; PRECURSOR; SIMULATION; SURFACES; TITANIUM
- Descriptors DEC
- CONFIGURATION; ELEMENTS; METALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.