Published July 11, 2002
| Version v1
Journal article
Measurements with a CMOS pixel sensor in magnetic fields
Description
CMOS technique, which is the standard process used by most of the semiconductor factories worldwide, allows the production of both cheap and highly integrated sensors. The prototypes MIMOSA -I and MIMOSA-II were designed by the IReS-LEPSI collaboration in order to investigate the potential of this new technique for charged particle tracking (Design and Testing of Monolithic Active Pixel Sensors for Charged Particle Tracking, LEPSI, IN2P3, Strasbourg, France). For this purpose it is necessary to study the effects of magnetic fields as they appear in high-energy physics on these sensors
Additional details
Identifiers
- PII
- S0168900202009609;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 487
- Journal Issue
- 1-2
- Journal Page Range
- p. 163-169
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34008203
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHARGED PARTICLE DETECTION; HIGH ENERGY PHYSICS; MAGNETIC FIELDS; MOS TRANSISTORS; PARTICLE TRACKS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- DETECTION; MEASURING INSTRUMENTS; PHYSICS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; TRANSISTORS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.