Characterization of the intermediate in formation of selenate-substituted ettringite
- 1. Department of Earth Resource Engineering, Kyushu University, Fukuoka 819-0395 (Japan)
Description
Precipitation of SeO42−-substituted ettringite is an efficient method to immobilize SeO42− under alkaline conditions. The effect of SO42− on SeO42− immobilization was investigated, because SO42− is one of the major ions in aqueous and soil environments and it is easily incorporated in ettringite. We aimed to systemically elucidate the formation mechanisms of SeO42−-substituted ettringite with and without SO42−. When SO42− and SeO42− coexisted, both oxoanions were immediately coprecipitated with ettringite after adding a Ca source. Although SO42− was partially substituted by SeO42− in ettringite, no other phases were formed during the process. Without SO42−, SeO42−-substituted AFm phase was formed as an intermediate, confirmed by X-ray diffraction peak at d 2.878, as well as by scanning electron microscopy with energy dispersive X-ray spectroscopy and zeta potential measurements. It is clear that the incorporation mechanism of SeO42− in ettringite is dependent on coexisting SO42− in aqueous environments. - Highlights: • SO42− is preferentially incorporated in ettringite over SeO42−. • Coexisting SO42− influences immobilization of SeO42−. • SO42−–hydrocalumite is proved as an intermediate. • The zeta potential and SEM-EDX support the XRD results.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.cemconres.2017.05.002Additional details
Identifiers
- DOI
- 10.1016/j.cemconres.2017.05.002;
- PII
- S0008-8846(16)30825-0;
Publishing Information
- Journal Title
- Cement and Concrete Research
- Journal Volume
- 99
- Journal Page Range
- p. 30-37
- ISSN
- 0008-8846
- CODEN
- CCNRAI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49051302
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; ELECTRON SCANNING; IONS; RADIOACTIVE WASTES; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MATERIALS; MICROSCOPY; RADIOACTIVE MATERIALS; SCATTERING; SPECTROSCOPY; WASTES
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.