Published September 2017 | Version v1
Journal article

Characterization of the intermediate in formation of selenate-substituted ettringite

  • 1. Department of Earth Resource Engineering, Kyushu University, Fukuoka 819-0395 (Japan)

Description

Precipitation of SeO42−-substituted ettringite is an efficient method to immobilize SeO42− under alkaline conditions. The effect of SO42− on SeO42− immobilization was investigated, because SO42− is one of the major ions in aqueous and soil environments and it is easily incorporated in ettringite. We aimed to systemically elucidate the formation mechanisms of SeO42−-substituted ettringite with and without SO42−. When SO42− and SeO42− coexisted, both oxoanions were immediately coprecipitated with ettringite after adding a Ca source. Although SO42− was partially substituted by SeO42− in ettringite, no other phases were formed during the process. Without SO42−, SeO42−-substituted AFm phase was formed as an intermediate, confirmed by X-ray diffraction peak at d 2.878, as well as by scanning electron microscopy with energy dispersive X-ray spectroscopy and zeta potential measurements. It is clear that the incorporation mechanism of SeO42− in ettringite is dependent on coexisting SO42− in aqueous environments. - Highlights: • SO42− is preferentially incorporated in ettringite over SeO42−. • Coexisting SO42− influences immobilization of SeO42−. • SO42−–hydrocalumite is proved as an intermediate. • The zeta potential and SEM-EDX support the XRD results.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.cemconres.2017.05.002

Additional details

Identifiers

DOI
10.1016/j.cemconres.2017.05.002;
PII
S0008-8846(16)30825-0;

Publishing Information

Journal Title
Cement and Concrete Research
Journal Volume
99
Journal Page Range
p. 30-37
ISSN
0008-8846
CODEN
CCNRAI

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49051302
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; ELECTRON SCANNING; IONS; RADIOACTIVE WASTES; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
Descriptors DEC
CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MATERIALS; MICROSCOPY; RADIOACTIVE MATERIALS; SCATTERING; SPECTROSCOPY; WASTES

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.