Development of CdTe line sensors for a fast X-ray CT scanner
Creators
- 1. National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki (Japan)
- 2. Hamamatsu Photonics K.K., Hamamatsu, Shizuoka (Japan)
- 3. National Institute of Laser, Plasma and Radiation Physics, Bucharest-Magurele (Romania)
- 4. University of Kagoshima, Kagoshima (Japan)
Description
A Fast scanning X-ray CT system was developed to visualize dynamic motion of interface in multi-phase flow. The scanning time less than 4 msec. was achieved by using 18 pulsed X-ray generators and highly sensitive 256-pixel CdTe line sensor modules. The sensor device technology is based on their prototypes previously assembled for high-resolution radiography and tomography imaging of electronic parts. Equipped with the above CdTe modules, the fast X-ray CT system was able to visualize the 50 mm diameter cross section with a spatial resolution of 2.8 mm. When the system was applied to an air-water two-phase flow and a simplified fluidized bed system, it successfully quantified the multi-dimensional characteristics of interface in flow. (author)
Additional details
Publishing Information
- Journal Title
- Hoshasen
- Journal Volume
- 27
- Journal Issue
- 2
- Journal Page Range
- p. 29-39
- ISSN
- 0285-3604
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 33007537
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AIR; CDTE SEMICONDUCTOR DETECTORS; COMPUTERIZED TOMOGRAPHY; FLOW VISUALIZATION; INTERFACES; MOTION; MULTIPHASE FLOW; SPATIAL RESOLUTION; WATER; X RADIATION
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; FLUID FLOW; FLUIDS; GASES; HYDROGEN COMPOUNDS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; OXYGEN COMPOUNDS; RADIATION DETECTORS; RADIATIONS; RESOLUTION; SEMICONDUCTOR DETECTORS; TOMOGRAPHY
Optional Information
- Notes
- 15 refs., 11 figs., 1 tab.