Published May 31, 2010
| Version v1
Journal article
Preparation of diamond-like carbon films by cathodic micro-arc discharge in aqueous solutions
Creators
- 1. Department of Material Physics and Chemistry, School of Material Science and Technology, University of Science and Technology Beijing, 100083, Beijing (China)
Description
Diamond-like carbon films (DLC) and silicon doped diamond-like carbon films were deposited on Ni substrate by cathodic micro-arc discharge at room temperature in aqueous solutions. The deposit potential was 130 V. The structure of the films was characterized by a scanning electron microscope (SEM), X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Raman spectra and XPS analysis demonstrated that the films were diamond-like carbon clearly. SEM observation showed that the DLC films were uniform and the thickness was about 200 nm. Potentiodynamic polarization curve indicated the corrosion resistance of the Ni substrate was markedly improved by DLC films.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2009.12.078Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2009.12.078;
- PII
- S0040-6090(09)02060-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 518
- Journal Issue
- 15
- Journal Page Range
- p. 4211-4214
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42054934
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AQUEOUS SOLUTIONS; CORROSION; CORROSION RESISTANCE; DEPOSITS; DIAMONDS; DOPED MATERIALS; PHOTOEMISSION; PLASMA; POLARIZATION; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; CHEMICAL REACTIONS; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; FILMS; HOMOGENEOUS MIXTURES; IONIZING RADIATIONS; LASER SPECTROSCOPY; MATERIALS; MICROSCOPY; MINERALS; MIXTURES; NONMETALS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SECONDARY EMISSION; SEMIMETALS; SOLUTIONS; SPECTRA; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.