Published December 31, 2003 | Version v1
Journal article

Weak localization of holes in acceptor-doped SiGe quantum wells

Description

Negative magnetoresistance is observed in boron-doped SiGe/Si quantum-well structures. The effect of a random potential caused by charged boron δ-layers in barriers on quantum corrections to the conductivity is observed and explained. Elastic and inelastic scattering times of holes as well as the magnitude of the random potential are determined

Additional details

Identifiers

DOI
10.1016/j.physb.2003.09.226;
PII
S092145260300886X;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
340-342
Journal Issue
3-4
Journal Page Range
p. 827-830
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
22. international conference on defects in semiconductors
Dates
28 Jul - 1 Aug 2003
Place
Aarhus (Denmark)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37000682
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BORON; CORRECTIONS; DOPED MATERIALS; GERMANIUM; HOLES; INELASTIC SCATTERING; INTERMETALLIC COMPOUNDS; LAYERS; MAGNETORESISTANCE; POTENTIALS; QUANTUM WELLS; RANDOMNESS; SILICON
Descriptors DEC
ALLOYS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; MATERIALS; METALS; NANOSTRUCTURES; PHYSICAL PROPERTIES; SCATTERING; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.