Published October 1990
| Version v1
Journal article
Fast multiline low-Z impurity imaging diagnostic for fluctuation and particle confinement studies
Creators
- 1. Fusion Research Laboratory, University of Missouri, Columbia, MO (USA)
Description
A system for imaging complete tokamak edge cross sections using radiation from intrinsic low-Z impurities, such as carbon, with a frequency response of 500 kHz and a spatial resolution of 1--4 cm (depending on the thickness of the radiating region) is being developed. The noise level is determined by the electronics and is ≤2% for the full 500 kHz bandwidth and ≤1% for a 100 kHz subset of that bandwidth. Photon noise is 0.3% for the full 500 kHz bandwidth. This diagnostic can be used for studying fluctuations in Prad(λ), Γz, and Te. Additionally it may be useful for studying marfes and detached plasmas, transport and oscillations during pellet injection, and as a fast disruption precursor monitor
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 61
- Journal Issue
- 10
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 3064-3066
- ISSN
- 0034-6748
- CODEN
- RSINA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22020644
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- AMPLIFICATION; CARBON; ELECTRON TEMPERATURE; ELECTRONIC CIRCUITS; FIBERS; FLUCTUATIONS; IMAGE PROCESSING; IMPURITIES; KHZ RANGE 100-1000; MONITORS; PELLET INJECTION; PHOTODIODES; PLASMA DIAGNOSTICS; PLASMA DISRUPTION; PRECURSOR; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; SPECIFICATIONS; THICKNESS; TOKAMAK DEVICES
- Descriptors DEC
- CLOSED PLASMA DEVICES; DIMENSIONS; ELEMENTS; FREQUENCY RANGE; KHZ RANGE; MEASURING INSTRUMENTS; NONMETALS; RESOLUTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; THERMONUCLEAR DEVICES; VARIATIONS