Published October 2009 | Version v1
Journal article

An extended study of the etching characteristics of CR-39 detectors

  • 1. National Institute for Occupational Safety and Prevention (ISPESL), Via Fontana Candida 1, 00040 Monteporzio Catone, Rome (Italy)
  • 2. Politecnico di Milano, Dipartimento Energia, via G. Ponzio 34/3, I-20133 Milan (Italy)
  • 3. Health, Safety and Environment Group, Bhabha Atomic Research Centre, Mumbai 400094 (India)

Description

An analysis concerning the bulk etch rate of different type of CR-39 subjected to a chemical etching in 5.4 N KOH solution at 80 deg. C is carried out in the present work. The response of PADC samples has been evaluated adopting the fission fragment track diameter method. A standard quality control program for etching has been set up by monitoring the electrical conductivity of the etchant. Since the properties of the etching solution are constant during the etching process the difference in the Vb values are connected to the intrinsic characteristics of the CR-39 plastic such as polymerization processes.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radmeas.2009.10.026

Additional details

Identifiers

DOI
10.1016/j.radmeas.2009.10.026;
PII
S1350-4487(09)00202-9;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
44
Journal Issue
9-10
Journal Page Range
p. 787-790
ISSN
1350-4487
CODEN
RMEAEP

Conference

Title
24. international conference on nuclear tracks in solids
Dates
1-5 Sep 2008
Place
Bologna (Italy)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41079421
Subject category
S61: RADIATION PROTECTION AND DOSIMETRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DIELECTRIC TRACK DETECTORS; ELECTRIC CONDUCTIVITY; ETCHING; FISSION FRAGMENTS; POLYMERIZATION; POTASSIUM HYDROXIDES; QUALITY CONTROL
Descriptors DEC
ALKALI METAL COMPOUNDS; CHEMICAL REACTIONS; CONTROL; ELECTRICAL PROPERTIES; HYDROGEN COMPOUNDS; HYDROXIDES; MEASURING INSTRUMENTS; NUCLEAR FRAGMENTS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POTASSIUM COMPOUNDS; RADIATION DETECTORS; SURFACE FINISHING

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.