Published October 2009
| Version v1
Journal article
An extended study of the etching characteristics of CR-39 detectors
Creators
- 1. National Institute for Occupational Safety and Prevention (ISPESL), Via Fontana Candida 1, 00040 Monteporzio Catone, Rome (Italy)
- 2. Politecnico di Milano, Dipartimento Energia, via G. Ponzio 34/3, I-20133 Milan (Italy)
- 3. Health, Safety and Environment Group, Bhabha Atomic Research Centre, Mumbai 400094 (India)
Description
An analysis concerning the bulk etch rate of different type of CR-39 subjected to a chemical etching in 5.4 N KOH solution at 80 deg. C is carried out in the present work. The response of PADC samples has been evaluated adopting the fission fragment track diameter method. A standard quality control program for etching has been set up by monitoring the electrical conductivity of the etchant. Since the properties of the etching solution are constant during the etching process the difference in the Vb values are connected to the intrinsic characteristics of the CR-39 plastic such as polymerization processes.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.radmeas.2009.10.026Additional details
Identifiers
- DOI
- 10.1016/j.radmeas.2009.10.026;
- PII
- S1350-4487(09)00202-9;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 44
- Journal Issue
- 9-10
- Journal Page Range
- p. 787-790
- ISSN
- 1350-4487
- CODEN
- RMEAEP
Conference
- Title
- 24. international conference on nuclear tracks in solids
- Dates
- 1-5 Sep 2008
- Place
- Bologna (Italy)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41079421
- Subject category
- S61: RADIATION PROTECTION AND DOSIMETRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIELECTRIC TRACK DETECTORS; ELECTRIC CONDUCTIVITY; ETCHING; FISSION FRAGMENTS; POLYMERIZATION; POTASSIUM HYDROXIDES; QUALITY CONTROL
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CHEMICAL REACTIONS; CONTROL; ELECTRICAL PROPERTIES; HYDROGEN COMPOUNDS; HYDROXIDES; MEASURING INSTRUMENTS; NUCLEAR FRAGMENTS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POTASSIUM COMPOUNDS; RADIATION DETECTORS; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.