Magnetic resonance force microscopy in fast-relaxing spins using a frequency-modulation mode detection method
- 1. Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 305-701 (Korea, Republic of)
Description
We describe a magnetic resonance force microscopy experiment carried out using both a fast-relaxing spin system and a frequency-modulation mode detection method, presenting a validation of the measured signal and sensitivity. The detection method applied along with a self-excited cantilever oscillation worked stably without any serious interference due to spurious cantilever excitation despite application of first-harmonic microwave modulation, and thereby successfully created almost the maximum available signal. The signal could be measured without distortion while the magnetic field was swept at a rate of 1.9 G s-1. The measured sensitivity approached the thermal noise limit of the cantilever with a high quality factor. The experimental results for both signal and noise were in good agreement with theoretical predictions
Additional details
Identifiers
- DOI
- 10.1088/0957-4484/18/37/375505;
- PII
- S0957-4484(07)50320-X;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 18
- Journal Issue
- 37
- Journal Page Range
- p. 375505
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39040610
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- FREQUENCY MODULATION; INTERFERENCE; MAGNETIC FIELDS; MAGNETIC RESONANCE; MICROSCOPY; MICROWAVE RADIATION; OSCILLATIONS; QUALITY FACTOR; SENSITIVITY; SIGNALS; SPIN; VALIDATION
- Descriptors DEC
- ANGULAR MOMENTUM; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; MODULATION; PARTICLE PROPERTIES; RADIATIONS; RESONANCE; TESTING