Published August 1, 1978
| Version v1
Journal article
A γ-ray diffractometer for systematic measurements of absolute structure factors
Creators
- 1. Hahn-Meitner-Institut fuer Kernforschung Berlin G.m.b.H. (Germany, F.R.)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Acta Crystallogr., Sect. A
- Journal Volume
- 34
- Journal Issue
- pt.S4
- Series
- Acta Crystallogr., Sect. A.
- Journal Page Range
- 336
- ISSN
- 0567-7394
Conference
- Title
- 11. international congress of the International Union of Crystallography.
- Dates
- 3 - 12 Aug 1978.
- Place
- Warsaw, Poland.
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 10470951
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BRAGG REFLECTION; COPPER; GAMMA DIFFRACTOMETERS; MONOCHROMATIC RADIATION; MONOCRYSTALS
- Descriptors DEC
- CRYSTALS; DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; ELEMENTS; MEASURING INSTRUMENTS; METALS; RADIATIONS; REFLECTION; TRANSITION ELEMENTS
Optional Information
- Notes
- Published in summary form only.