Published 2003 | Version v1
Miscellaneous Metadata-only

A Si(Li) detector system used to measure energy of swift heavy ion

Creators

  • 1. Chinese Academy of Sciences, Lanzhou (China). Inst. of Modern Physics
  • 2. Chinese Academy of Sciences, Beijing (China). Center for Space Science and Applied Research

Description

Ion energy is an important parameter in simulation experiment of single event effect for semiconductor device used in space. An energy measurement system consisting of a Si(Li) detector of 3.5 mm thick has been developed. It can measure various ions delivered by HIRFL from several hundred MeV to several GeV. The correlative factors of influencing measurement precision are discussed

Part of:
Proceedings of the 11th national conference on nuclear electronics and nuclear detection technology

Additional details

Publishing Information

Imprint Title
Proceedings of the 11th national conference on nuclear electronics and nuclear detection technology
Imprint Pagination
598 p.
Journal Page Range
p. 309-311

Conference

Title
11. national conference on nuclear electronics and nuclear detection technology
Dates
1-6 Dec 2002
Place
Xiamen (China)

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
35048875
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ENERGY; ENERGY RESOLUTION; GEV RANGE 01-10; HEAVY IONS; HIRFL CYCLOTRON; LI-DRIFTED SI DETECTORS; MEASURING METHODS; MEV RANGE 100-1000; PERFORMANCE TESTING; RADIATION EFFECTS; SIMULATION
Descriptors DEC
ACCELERATORS; CHARGED PARTICLES; CYCLIC ACCELERATORS; CYCLOTRONS; ENERGY RANGE; GEV RANGE; HEAVY ION ACCELERATORS; IONS; ISOCHRONOUS CYCLOTRONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MEV RANGE; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; TESTING

Optional Information