Published October 2003
| Version v1
Journal article
Evaluation of E-J characteristics of YBCO-coated conductor in a wide range of electric field
Description
The E-J characteristics were measured for a YBCO-coated conductor by using the four probe method and the relaxation method of DC magnetization. The result on the latter measurement at extremely low electric fields was theoretically analyzed based on the flux creep-flow model. From the result on n-value the flux lines in YBCO are considered to be in the glass state even at high fields. The apparent pinning potential U0* estimated from the relaxation of DC magnetization is much larger than that of Bi-2223. The present theoretical analysis clarifies a much stronger flux pinning and a higher dimensionality of YBCO in comparison with Bi-2223
Additional details
Identifiers
- DOI
- 10.1016/S0921-4534;
- PII
- S0921453403011201;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 392-396
- Journal Issue
- 1-4
- Journal Page Range
- p. 1073-1077
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 15. international symposium on superconductivity: Advances in superconductivity XV. Part I
- Acronym
- ISS 2002
- Dates
- 11-13 Nov 2002
- Place
- Yokohama (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37076236
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BARIUM COMPOUNDS; COMPARATIVE EVALUATIONS; CREEP; CRITICAL CURRENT; CUPRATES; CURRENT DENSITY; ELECTRIC FIELDS; FLOW MODELS; HIGH-TC SUPERCONDUCTORS; MAGNETIC FLUX; MAGNETIZATION; POTENTIALS; RELAXATION; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; COPPER COMPOUNDS; CURRENTS; ELECTRIC CURRENTS; EVALUATION; MATHEMATICAL MODELS; MECHANICAL PROPERTIES; OXYGEN COMPOUNDS; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS; TYPE-II SUPERCONDUCTORS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.