Published 1984
| Version v1
Miscellaneous
Moessbauer and X Ray diffraction studies in (In16 Te84)1-x Snx and (Ge85 Te 15)1-x Snx amorphous alloys
Creators
- 1. Buenos Aires Univ. (Argentina). Faculdad de Ingenieria
Description
Solid samples of (In16 Te84)1-x Snx and (Ge15 Te85)1-x Snx were obtained by means of splat-cooling techniques. The materials was cooled down from different initial temperatures of the liquid state and the samples were analysed by Moessbauer Spectroscopopy and X Ray diffraction. (M.W.O.)
Abstract (Portuguese)
Utilizando-se tecnicas de 'splat-cooling', obtiveram-se as ligas (In 16 Te84)1-x Snx e (Ge15 Te85)1-x Snx. O material foi resfriado do estado liquido a partir de diferentes temperaturas inciciais e as amostras foram analisadas atraves de Espectroscopia Moessbauere Difracao de Raios X. (M.W.O.)Additional details
Additional titles
- Original title (no language)
- Anais do Simposio Latino-Americano de Fisica dos Sistemas Amorfos - v.2.
Publishing Information
- Imprint Title
- Proceedings of the Latin American Symposium of Physics of Amorphous Systems- v.2
- Imprint Pagination
- 265 p.
- Journal Page Range
- p. 434-437.
- Report number
- INIS-BR--903
Conference
- Title
- Latin American Symposium of Physics of Amorphous Systems.
- Dates
- 27 Feb - 2 Mar 1984.
- Place
- Niteroi, RJ (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 18096379
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ALLOY SYSTEMS; EXPERIMENTAL DATA; FABRICATION; MOESSBAUER EFFECT; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DATA; DIFFRACTION; INFORMATION; NUMERICAL DATA; SCATTERING
Optional Information
- Notes
- Imprint:Anais do Simposio Latino-Americano de Fisica dos Sistemas Amorfos - v.2.