Published January 24, 2003 | Version v1
Journal article

Strain Effects in La0.7Sr0.3MnO3 Films by X-ray Absorption Spectroscopy

  • 1. LMCP Laboratoire de Mineralogie -Cristallographie, UMR 7590 CNRS, Paris (France)
  • 2. LNLS Laboratorio Nacional de Luz Sincrotron, CP6192, 13084-971 Campinas, SP (Brazil)
  • 3. IFGW, Universidade Estadual de Campinas CP6165, 13083-970 Campinas SP (Brazil)
  • 4. Laboratoire Louis Neel, UPR5051 CNRS, Grenoble (France)

Description

We report on Mn K-edge X-ray absorption study, in plane and out of plane, of La0.7Sr0.3MnO3 films, epitaxially grown on a tensile substrate SrTiO3 by laser ablation. From Extended X-ray Absorption Fine Structure in the film plane we observe a small increase of Mn-Mn distances with respect to relaxed film. In addition, a small distortion of the MnO6 octahedron is evidenced from Extended and Near Edge Absorption measurements. The respective amplitudes found for these two effects are on the same order, so that no modification of the Mn-O-Mn angle is evidenced

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
652
Journal Issue
1
Journal Page Range
p. 456-461
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
19. International conference on X-ray and inner-shell processes
Dates
24-28 Jun 2002
Place
Rome (Italy)

Optional Information

Notes
(c) 2003 American Institute of Physics