Design of SRAM single event effect monitoring system

The SRAM single event effect monitoring system, which is composed of a daughter board, a mother board and a control computer, is used for single event effect experiments in Irradiation Terminal of the Heavy Ion Research Facility in Lanzhou (HIRFL). It briefly analysis single event effect in SRAM, and then describe hardware components, software system and performance index in details. This system have detected single event upset and single event latch-up of IDT71256 many times in radiation experiments, and the experimental data are basically consistent with expectations, verifying the reliability of this system. (authors)