Published April 15, 1983 | Version v1
Journal article

EXAFS in dispersive mode

  • 1. Poitiers Univ., 86 (France). Lab. Met. Physique
  • 2. Laboratoire pour l'Utilisation du Rayonnement Electromagnetique (LURE), Paris-11 Univ., 91 - Orsay (France)
  • 3. Paris-11 Univ., 91 - Orsay (France). Lab. de Physique des Solides
  • 4. College de France, 75 - Paris. Lab. de Physique de la Matiere Condensee

Description

The new method of collecting EXAFS data in dispersive mode will be recalled. Polychromatic radiation is used so that data over the entire EXAFS spectrum can be recorded simultaneously. The improved efficiency in data collection opens up the possibility of kinetic studies in material science, chemistry and biophysics. The first data obtained with a self-scanned photodiode array manufactured by EGandG Reticon (RC 256 EC/17) working at room temperature show that XANES study at a few ms time-scale can be expected since only 1.3 ms were required to collect the XANES plot of elemental Ni, the D.C.I. storage ring running at a 1.72 GeV, 250 mA positron energy and current. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res.
Journal Volume
208
Journal Issue
1-3
Series
Nucl. Instrum. Methods Phys. Res.
Journal Page Range
651-654
ISSN
0029-554X

Conference

Title
International conference on X-Ray and VUV synchrotron radiation instrumentation.
Dates
9-13 Aug 1982.
Place
Hamburg (Germany, F.R.).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
14796741
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; CALIBRATION; DATA PROCESSING; PHOTODIODES; RESOLUTION; X-RAY DETECTION; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
Descriptors DEC
DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTROMETERS; SPECTROSCOPY