Published April 15, 1983
| Version v1
Journal article
EXAFS in dispersive mode
- 1. Poitiers Univ., 86 (France). Lab. Met. Physique
- 2. Laboratoire pour l'Utilisation du Rayonnement Electromagnetique (LURE), Paris-11 Univ., 91 - Orsay (France)
- 3. Paris-11 Univ., 91 - Orsay (France). Lab. de Physique des Solides
- 4. College de France, 75 - Paris. Lab. de Physique de la Matiere Condensee
Description
The new method of collecting EXAFS data in dispersive mode will be recalled. Polychromatic radiation is used so that data over the entire EXAFS spectrum can be recorded simultaneously. The improved efficiency in data collection opens up the possibility of kinetic studies in material science, chemistry and biophysics. The first data obtained with a self-scanned photodiode array manufactured by EGandG Reticon (RC 256 EC/17) working at room temperature show that XANES study at a few ms time-scale can be expected since only 1.3 ms were required to collect the XANES plot of elemental Ni, the D.C.I. storage ring running at a 1.72 GeV, 250 mA positron energy and current. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res.
- Journal Volume
- 208
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods Phys. Res.
- Journal Page Range
- 651-654
- ISSN
- 0029-554X
Conference
- Title
- International conference on X-Ray and VUV synchrotron radiation instrumentation.
- Dates
- 9-13 Aug 1982.
- Place
- Hamburg (Germany, F.R.).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 14796741
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; CALIBRATION; DATA PROCESSING; PHOTODIODES; RESOLUTION; X-RAY DETECTION; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTROMETERS; SPECTROSCOPY