Published May 2010
| Version v1
Journal article
Photoelectron spectromicroscopy and spectronanoscopy at synchrotrons: Growing impact on life sciences and materials science
Creators
- 1. Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne (Switzerland)
Description
We review the historical and recent development of experimental techniques that are based on the combination of photoemission spectroscopy and high lateral resolution. The discussion specifically deals with the essential features of the two main classes of approaches in this domain-scanning spectromicroscopy and the techniques based on electron optics. Selected examples are presented to illustrate the exceptional capabilities made possible by the technological advances of recent years. The article is concluded by a short discussion of the foreseeable future of this fast-developing field.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2009.05.007Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2009.05.007;
- PII
- S0368-2048(09)00123-6;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 178-179
- Journal Page Range
- p. 273-291
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41085674
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ELECTRONS; MATERIALS; OPTICS; PHOTOEMISSION; RESOLUTION; REVIEWS; SPECTROSCOPY; SYNCHROTRONS; X RADIATION
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; DOCUMENT TYPES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EMISSION; FERMIONS; IONIZING RADIATIONS; LEPTONS; RADIATIONS; SECONDARY EMISSION
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.