Published May 2010 | Version v1
Journal article

Photoelectron spectromicroscopy and spectronanoscopy at synchrotrons: Growing impact on life sciences and materials science

  • 1. Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne (Switzerland)

Description

We review the historical and recent development of experimental techniques that are based on the combination of photoemission spectroscopy and high lateral resolution. The discussion specifically deals with the essential features of the two main classes of approaches in this domain-scanning spectromicroscopy and the techniques based on electron optics. Selected examples are presented to illustrate the exceptional capabilities made possible by the technological advances of recent years. The article is concluded by a short discussion of the foreseeable future of this fast-developing field.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2009.05.007

Additional details

Identifiers

DOI
10.1016/j.elspec.2009.05.007;
PII
S0368-2048(09)00123-6;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
178-179
Journal Page Range
p. 273-291
ISSN
0368-2048
CODEN
JESRAW

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41085674
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
ELECTRONS; MATERIALS; OPTICS; PHOTOEMISSION; RESOLUTION; REVIEWS; SPECTROSCOPY; SYNCHROTRONS; X RADIATION
Descriptors DEC
ACCELERATORS; CYCLIC ACCELERATORS; DOCUMENT TYPES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EMISSION; FERMIONS; IONIZING RADIATIONS; LEPTONS; RADIATIONS; SECONDARY EMISSION

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.