Published August 23, 2009 | Version v1
Report

Suppression of shot noise and spontaneous radiation in electron beams

Description

Shot noise in the electron beam distribution is the main source of noise in high-gain FEL amplifiers, which may affect applications ranging from single- and multi-stage HGHG FELs to an FEL amplifier for coherent electron cooling. This noise also imposes a fundamental limit of about 106 on FEL gain, after which SASE FELs saturate. There are several advantages in strongly suppressing this shot noise in the electron beam, and the corresponding spontaneous radiation. For more than a half-century, a traditional passive method has been used successfully in practical low-energy microwave electronic devices to suppress shot noise. Recently, it was proposed for this purpose in FELs. However, being passive, the method has some significant limitations and is hardly suitable for the highly inhomogeneous beams of modern high-gain FELs. I present a novel active method of suppressing, by many orders-of-magnitude, the shot noise in relativistic electron beams. I give a theoretical description of the process, and detail its fundamental limitation.

Availability note (English)

Available from http://www.bnl.gov/isd/documents/70615.pdf; PURL: https://www.osti.gov/servlets/purl/970529-P2HiH8/

Additional details

Publishing Information

Imprint Pagination
8 p.
Report number
BNL--90327-2009-CP

Conference

Title
Free Electron Laser Conference
Acronym
FEL 2009
Dates
23-28 Aug 2009
Place
Liverpool (United Kingdom)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
41040618
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
AMPLIFIERS; DISTRIBUTION; ELECTRON BEAMS; ELECTRON COOLING; FREE ELECTRON LASERS; RADIATIONS
Descriptors DEC
BEAM COOLING; BEAMS; ELECTRONIC EQUIPMENT; EQUIPMENT; LASERS; LEPTON BEAMS; PARTICLE BEAMS

Optional Information

Contract/Grant/Project number
KB0202011; AC02-98CH10886
Notes
10820 - 10821
Funding organization
Doe - Office Of Science (United States)