Published 1988
| Version v1
Book
Pressure-induced preferred orientation in YBa2Cu3O7-x high-Tc superconducting ceramics
Description
The pressure-induced preferentially oriented structures developed in the process of preparing YBa2Cu3O7-x high Tc superconducting ceramics have been quantitatively measured by using the F- parameter method in X-ray powder diffraction and examined by scanning electron microscopy. The relations between oriented structures and the processing conditions such as pressure and heat treatments have been studied. Results show that the pressure-induced oriented structures which exist only in a thin surface layer have close relations with pressure as well as heat treatments which are carried out before the pressure is applied, but they do not affect the superconducting critical current densities of the samples in an obvious way
Additional details
Publishing Information
- Publisher
- International Cryogenics Materials Conference (ICMC).
- Imprint Place
- Boulder, CO (USA)
- Imprint Title
- Cryogenic materials '88
- Imprint Pagination
- 449 p.
- Series
- Volume 1. Superconductors.
- Journal Page Range
- p. 203-210.
Conference
- Title
- applications and properties.
- Acronym
- International conference on cryogenic materials
- Dates
- 7-10 Jun 1988.
- Place
- Shenyang (China).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21056138
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BARIUM OXIDES; COPPER OXIDES; CRITICAL CURRENT; CURRENT DENSITY; FABRICATION; GRAIN ORIENTATION; HEAT TREATMENTS; HIGH TEMPERATURE; POWDERS; PRESSURE DEPENDENCE; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTIVITY; SUPERCONDUCTORS; X-RAY DIFFRACTION; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL STRUCTURE; CURRENTS; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; MICROSCOPY; MICROSTRUCTURE; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-880653--.