Correction of measurement by HP-Ge detector for incident diagnostic X-ray photons
Creators
- 1. Kanazawa Univ., Faculty of Medicine, Department of Radiological Technology, School of Health Sciences, Kanazawa, Ishikawa (Japan)
Description
It is necessary to obtain corrected X-ray spectra in order to produce diagnostic images and to evaluate exposure dose. In this study, the compensation of a spectra obtained using a high-purity germanium crystal was performed using Monte Carlo simulation code EGS4. The photon energy of the high-purity germanium crystal was consistent with manufacturer specifications. The stripping method was used to eliminate scattered radiation inside the high-purity germanium semiconductor detector. The HP-Ge detector was used to obtain an absorption spectrum, which includes a component of photon interaction in the HP-Ge crystal. The component of the spectrum, including Photo-Peak, sum-escape, K-escape and Compton escape, attributable to the interaction between the-mono-energy state and high-purity germanium was obtained between 0 keV and the maximum energy of the X-ray tube using the Monte Carlo simulation code EGS4. The effect of scattered photons was successfully removed from the spectrum of photons emitted from the target of an X-ray Tube using this simulation code. It is important to apply this compensation in order to obtain correct spectra of incident photons inside the detector. (author)
Additional details
Publishing Information
- Imprint Title
- Proceedings of the second international workshop on EGS
- Imprint Pagination
- 352 p.
- Journal Page Range
- p. 235-241
- Report number
- KEK-PROC--2000-20
Conference
- Title
- 2. international workshop on EGS
- Dates
- 8-12 Aug 2000
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 33008071
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- COMPTON EFFECT; CORRECTIONS; DIAGNOSTIC TECHNIQUES; E CODES; ESCAPE PEAKS; HIGH-PURITY GE DETECTORS; K ABSORPTION; MONTE CARLO METHOD; SCATTERING; X-RAY SPECTRA
- Descriptors DEC
- ABSORPTION; BASIC INTERACTIONS; CALCULATION METHODS; COMPUTER CODES; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; GE SEMICONDUCTOR DETECTORS; INTERACTIONS; MEASURING INSTRUMENTS; PEAKS; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; SORPTION; SPECTRA
Optional Information
- Notes
- 2 refs., 7 figs., 1 tab.