Published December 2000 | Version v1
Report

Correction of measurement by HP-Ge detector for incident diagnostic X-ray photons

  • 1. Kanazawa Univ., Faculty of Medicine, Department of Radiological Technology, School of Health Sciences, Kanazawa, Ishikawa (Japan)

Description

It is necessary to obtain corrected X-ray spectra in order to produce diagnostic images and to evaluate exposure dose. In this study, the compensation of a spectra obtained using a high-purity germanium crystal was performed using Monte Carlo simulation code EGS4. The photon energy of the high-purity germanium crystal was consistent with manufacturer specifications. The stripping method was used to eliminate scattered radiation inside the high-purity germanium semiconductor detector. The HP-Ge detector was used to obtain an absorption spectrum, which includes a component of photon interaction in the HP-Ge crystal. The component of the spectrum, including Photo-Peak, sum-escape, K-escape and Compton escape, attributable to the interaction between the-mono-energy state and high-purity germanium was obtained between 0 keV and the maximum energy of the X-ray tube using the Monte Carlo simulation code EGS4. The effect of scattered photons was successfully removed from the spectrum of photons emitted from the target of an X-ray Tube using this simulation code. It is important to apply this compensation in order to obtain correct spectra of incident photons inside the detector. (author)

Part of:
Proceedings of the second international workshop on EGS

Additional details

Publishing Information

Imprint Title
Proceedings of the second international workshop on EGS
Imprint Pagination
352 p.
Journal Page Range
p. 235-241
Report number
KEK-PROC--2000-20

Conference

Title
2. international workshop on EGS
Dates
8-12 Aug 2000
Place
Tsukuba, Ibaraki (Japan)

Optional Information

Notes
2 refs., 7 figs., 1 tab.