Influence of cooling rate on optical properties and electrical properties of nanorod ZnO films
- 1. Key Lab for Magnetism and Magnetic Materials of MOE, Lanzhou University, Lanzhou 730000 (China)
Description
ZnO films are prepared on Ag-coated glass substrates by wet chemical method at low temperature using Zn(NO3).6H2O and dimethylamine borane complex (DMAB). The structural, electrical and optical properties of ZnO films are investigated by X-ray diffraction, scanning electron microscope, four-point probe method and photoluminescence, respectively. The ZnO film deposited at 90 oC is the most compact films with a c-axis preferred orientation. The cooling rate affects the optical and electrical properties of ZnO films dramatically. The ZnO films cooled at -15 oC exhibit the lowest electrical resistivity of 0.525 Ω cm and the strongest photoluminescence in visible light. The increase of the conductivity and the enhancement of the photoluminescence are attributed to the increase of oxygen vacancies in the films.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2010.03.236Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2010.03.236;
- PII
- S0925-8388(10)00762-0;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 500
- Journal Issue
- 2
- Journal Page Range
- p. 181-184
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42033460
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BORON COMPLEXES; COOLING; ELECTRIC CONDUCTIVITY; GLASS; GRAIN ORIENTATION; NANOSTRUCTURES; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; VACANCIES; VISIBLE RADIATION; X-RAY DIFFRACTION; ZINC NITRATES; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; COMPLEXES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; EMISSION; FILMS; LUMINESCENCE; MICROSCOPY; MICROSTRUCTURE; NITRATES; NITROGEN COMPOUNDS; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; POINT DEFECTS; RADIATIONS; SCATTERING; TEMPERATURE RANGE; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.