Published March 17, 2008
| Version v1
Journal article
Tunneling magnetoresistance in Fe-oxide film
- 1. Department of Physics and Chemistry and Institute of Nano Science and Technology, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong (China)
- 2. National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093 (China)
- 3. Department of Physics and Chemistry and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong (China)
Description
We fabricate Fe/Fe oxide granular film by DC sputtering and study the magnetic and transport properties in the insulator region. X-ray photoelectron spectroscopy and transmission electron microscopy confirm the coexistence of iron and Fe2O3. Accompanied with the nonlinear I-V curve and magnetic measurement, we investigate mechanism of sizable magnetoresistance in detail and found the spin in the interface has crucial contribution to the spin tunneling process
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2007.11.002Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2007.11.002;
- PII
- S0375-9601(07)01589-7;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 372
- Journal Issue
- 12
- Journal Page Range
- p. 2118-2122
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39085420
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- FERRITES; FILMS; INTERFACES; IRON OXIDES; MAGNETORESISTANCE; NONLINEAR PROBLEMS; PHOTOELECTRON SPECTROSCOPY; SPIN; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; TUNNEL EFFECT
- Descriptors DEC
- ANGULAR MOMENTUM; CHALCOGENIDES; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; FERRIMAGNETIC MATERIALS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.