Visible radiation sliced image emission velocimeter interferometer fluctuation diagnostic
- 1. Plasma Science and Fusion Center, M.I.T., Cambridge, Massachusetts 02139 (United States)
- 2. Plasma Physics Laboratory, Princeton University, Princeton, New Jersey 08543 (United States)
- 3. Science Research Laboratory, Somerville, Massachusetts 02143 (United States)
Description
An instrument designed to measure k-filtered plasma fluctuations has been used to look at edge fluctuations in Alcator C-Mod tokamak plasmas. The instrument utilizes a sieve technique, whereby an optical image is split and filtered through two out-of-phase, striped transmission masks, and then imaged onto photodiode detectors. The difference signal is then digitized and analyzed to give the frequency characteristics of the fluctuations at a particular value of k, as determined by the wavelength of the mask stripes. Measurements have been made looking at the edge plasma with hydrogen Balmer-alpha filtering, and k both parallel and perpendicular to the magnetic field, with |k| in the range from 5 to 15 cm-1. Broad band (ν<500kHz) fluctuations are seen for k perpendicular to B, and characteristics in ohmic and L-mode plasmas are described. copyright 1999 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 70
- Journal Issue
- 1
- Journal Page Range
- p. 976-978
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 12. topical conference on high-temperature plasma diagnostics
- Dates
- 7-11 Jun 1998
- Place
- Princeton, NJ (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30011131
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALCATOR DEVICE; FLUCTUATIONS; HYDROGEN; INTERFEROMETERS; INTERFEROMETRY; MAGNETIC FIELDS; PHOTODIODES; PLASMA DIAGNOSTICS; VELOCIMETERS; VISIBLE SPECTRA
- Descriptors DEC
- CLOSED PLASMA DEVICES; ELEMENTS; MEASURING INSTRUMENTS; NONMETALS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTRA; THERMONUCLEAR DEVICES; TOKAMAK DEVICES; VARIATIONS
Optional Information
- Secondary number(s)
- CONF-980605--