Published January 1999 | Version v1
Journal article

Visible radiation sliced image emission velocimeter interferometer fluctuation diagnostic

  • 1. Plasma Science and Fusion Center, M.I.T., Cambridge, Massachusetts 02139 (United States)
  • 2. Plasma Physics Laboratory, Princeton University, Princeton, New Jersey 08543 (United States)
  • 3. Science Research Laboratory, Somerville, Massachusetts 02143 (United States)

Description

An instrument designed to measure k-filtered plasma fluctuations has been used to look at edge fluctuations in Alcator C-Mod tokamak plasmas. The instrument utilizes a sieve technique, whereby an optical image is split and filtered through two out-of-phase, striped transmission masks, and then imaged onto photodiode detectors. The difference signal is then digitized and analyzed to give the frequency characteristics of the fluctuations at a particular value of k, as determined by the wavelength of the mask stripes. Measurements have been made looking at the edge plasma with hydrogen Balmer-alpha filtering, and k both parallel and perpendicular to the magnetic field, with |k| in the range from 5 to 15 cm-1. Broad band (ν<500kHz) fluctuations are seen for k perpendicular to B, and characteristics in ohmic and L-mode plasmas are described. copyright 1999 American Institute of Physics

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
70
Journal Issue
1
Journal Page Range
p. 976-978
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
12. topical conference on high-temperature plasma diagnostics
Dates
7-11 Jun 1998
Place
Princeton, NJ (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
30011131
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALCATOR DEVICE; FLUCTUATIONS; HYDROGEN; INTERFEROMETERS; INTERFEROMETRY; MAGNETIC FIELDS; PHOTODIODES; PLASMA DIAGNOSTICS; VELOCIMETERS; VISIBLE SPECTRA
Descriptors DEC
CLOSED PLASMA DEVICES; ELEMENTS; MEASURING INSTRUMENTS; NONMETALS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTRA; THERMONUCLEAR DEVICES; TOKAMAK DEVICES; VARIATIONS

Optional Information

Secondary number(s)
CONF-980605--