Contribution of core-loss fine structures to the characterization of ion irradiation damages in the nanolaminated ceramic Ti3AlC2
- 1. Département de Physique et Mécanique des Matériaux, Institut PPRIME, UPR 3346 CNRS-Université de Poitiers-ENSMA, SP2MI-Boulevard 3, Téléport 2-BP 30179, 86962 Futuroscope-Chasseneuil Cedex (France)
- 2. Thin Film Physics Division, Linköping University, IFM, 581 83 Linköping (Sweden)
Description
The effect of low-energy ion irradiation on the nanolaminated Ti3AlC2 is investigated by means of X-ray diffraction, transmission electron microscopy, electron energy loss and X-ray absorption spectroscopy. The chemical sensitivity and local order probing from core-loss edges provide new insights into the structural modifications induced under irradiation. From the analysis of the C K energy loss near-edge structure and Al K X-ray absorption near-edge structure by ab initio calculations, the influence of the layered structure of this compound on the irradiation damage is demonstrated, and damage is found to be preferentially localized in the aluminum planes of the structure. On the basis of comparisons between calculations and experimental spectra, a structural model is proposed for the irradiated state. This study emphasizes the utility of core-loss fine structure analysis to enhance understanding of ion irradiation-induced damage in complex crystalline materials
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2013.08.041Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2013.08.041;
- PII
- S1359-6454(13)00647-2;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 61
- Journal Issue
- 19
- Journal Page Range
- p. 7348-7363
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45038099
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTROSCOPY; ELECTRONIC STRUCTURE; ENERGY LOSSES; ENERGY-LOSS SPECTROSCOPY; FINE STRUCTURE; IRRADIATION; SENSITIVITY; SPECTRA; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; IONIZING RADIATIONS; LOSSES; MICROSCOPY; RADIATIONS; SCATTERING; SORPTION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.