Published August 1, 2018
| Version v1
Journal article
Effect of Heat Treatment on Structural Properties of Silica Borotellurite Glasses Containing MnO
- 1. Glass and Dielectric Lab, Department of Physics, Faculty of Science, University Putra Malaysia (Malaysia)
Description
{[(TeO2)0.7(B2O3)0.3]0.8[SiO2]0.2}1-x{MnO2}x where x = 0.00, 0.01, 0.02, 0.03, 0.04 and 0.05 molar fraction were prepared by using melt quenching technique. Heat treatment of the glass sample was performed at 600 °C for 3 hours. The structure of the glass samples was characterized by using Fourier Transform Infrared (FTIR) and X-ray diffraction (XRD). Crystalline phase was recorded after parent glass went through heat treatment process. The FTIR spectra for parent glass and heat treated glass samples validate the presence of TeO4, TeO3, BO4, BO3 and Si-O(Si) in the glass network. After the samples were heat treated, vibration from manganese group were detected in FTIR spectra. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1083/1/012001Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1083
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- International Conference of Solid State Science and Technology
- Acronym
- ICSSST 2017
- Dates
- 13-16 Nov 2017
- Place
- Penang (Malaysia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53023083
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BORATES; BORON OXIDES; FOURIER TRANSFORM SPECTROMETERS; GLASS; HEAT TREATMENTS; INFRARED SPECTRA; MANGANESE; MANGANESE OXIDES; SILICA; SILICON OXIDES; TELLURIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- BORON COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; MANGANESE COMPOUNDS; MEASURING INSTRUMENTS; METALS; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS; SPECTRA; SPECTROMETERS; TELLURIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS