Reprint of: Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. ("Pico" Festschrift, May 2021)
- 1. Center for Advanced Mathematics for Energy Research Applications, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
- 2. Department of Applied Mathematics, Lawrence Berkeley Laboratory, Berkeley, CA 94720 (United States)
- 3. Department of Physics, Arizona State University, Tempe, Arizona, 85287-1504 (United States)
Description
Highlights: • Remove multiple scattering artifacts from many-beam Bragg intensities in transmission electron diffraction. • Iterated projection algorithm doesn't need sample thickness, covers wide beam-energy range. • Solves phase problem , includes mean absorption, unaffected by lens phases. • Allows determination of chirality (hand) for enantiomorphs. Symmetry reduction discussed. • Extension to X-ray, neutron, micro-ED diffraction and cryo-EM may be possible. A method for recovering complex structure factors from many simultaneously excited Bragg beam in- tensities is described. The method is applied to simulated transmission electron diffraction data over a wide range of crystal thickness and beam energies. The method is based on iterated projections between structure and scattering matrices, which are related by a matrix unit ary transformation, exponential, which we invert. The algorithm removes multiple-scattering perturbations from diffraction data and might be extended to other fields, including X-ray and neutron diffraction and cryo-electron microscopy. Because coherent multiple scattering involves interference between Bragg beams, the method also solves the phase problem. Unlike dynamical inversion from electron microscope images or ptychography data, the method, which starts with Bragg beam intensities, provides complex structure factors unaffected by focusing errors or resolution limitations imposed by lenses. We provide inversions from simulated data with 441 simultaneously excited Bragg beams over a range of thickness and beam energy. We discuss the retrieval of chirality information from enantiomorphs, the efficient incorporation of symmetry information using the irreducible representation of the group of structure matrices, and the effect of HOLZ lines to provide three-dimensional information.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2021.113409Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2021.113409;
- PII
- S030439912100187X;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 231
- Journal Page Range
- vp.
- ISSN
- 0304-3991
- CODEN
- ULTRD6
Conference
- Title
- 6. Conference on Frontiers of Aberration Corrected Electron Microscopy
- Acronym
- PICO 2021
- Dates
- 2-6 May 2021
- Place
- Juelich (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54112272
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ALGORITHMS; BEAMS; CHIRALITY; COMPUTERIZED SIMULATION; CRYSTALS; ELECTRON DIFFRACTION; ENANTIOMORPHS; IRREDUCIBLE REPRESENTATIONS; MULTIPLE SCATTERING; NEUTRON DIFFRACTION; NEUTRONS; PERTURBATION THEORY; STRUCTURE FACTORS; SYMMETRY; THICKNESS; THREE-DIMENSIONAL CALCULATIONS; THREE-DIMENSIONAL LATTICES; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- BARYONS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; DIMENSIONLESS NUMBERS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; HADRONS; IONIZING RADIATIONS; ISOMERS; MATHEMATICAL LOGIC; NUCLEONS; PARTICLE PROPERTIES; RADIATIONS; SCATTERING; SIMULATION; SORPTION
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.