PIN diode and neutron spectrum measurements at the Army Pulse Radiation Facility
Creators
Description
The Army Pulse Radiation Facility (APRF) is a multi-faceted facility operating a Godiva type pulse reactor, housed in a low scatter aluminum silo 30m in diameter and 20m high. The reactor is movable to several locations and heights. Several well characterized exposure environments are available for experiments. When testing silicon devices against a nuclear threat, it is essential to consider the difference between the neutron energy spectrum of the threat environment and that of the test environment. In this paper, neutron spectrum measurements using the foil activation technique have been made in two widely varying environments. One is an extremely high neutron-to-gamma field and the other extremely low. These measurements were used to characterize the fields and to evaluate the use of the DN-156 PIN diode for measuring 1 MeV equivalent neutron fluence in silicon (Φ1MeV(Si)). The agreement between the Φ1MeV(Si) as measured with diodes and as determined by the spectral measurements was within ± 5%. A proton recoil neutron spectrum measurement was also made in the low gamma environment
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 41
- Journal Issue
- 6Pt1
- Journal Page Range
- p. 2132-2138.
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- 31. annual international nuclear and space radiation effects conference.
- Dates
- 18-22 Jul 1994.
- Place
- Tucson, AZ (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 26047798
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- APRF REACTOR; DAMAGING NEUTRON FLUENCE; EVALUATION; MEASURING METHODS; NEUTRON SPECTRA; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TEST FACILITIES
- Descriptors DEC
- EPITHERMAL REACTORS; FAST REACTORS; MEASURING INSTRUMENTS; NEUTRON FLUENCE; RADIATION DETECTORS; RADIATION EFFECTS; REACTORS; RESEARCH AND TEST REACTORS; RESEARCH REACTORS; SPECTRA
Optional Information
- Secondary number(s)
- CONF-940726--.