Published February 1983
| Version v1
Journal article
Interferometric and non interferometric optical inspection of semiconductor wafers and semiconductor laser mirrors
- 1. Centro de Investigaciones Oticas, La Plata (Argentina)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Rev. Bras. Fis.
- Journal Volume
- especial)
- Series
- Rev. Bras. Fis.
- Journal Page Range
- 475
- ISSN
- 0374-4922
Conference
- Title
- 1. Brazilian School on Semiconductor Physics.
- Dates
- 31 Jan - 11 Feb 1983.
- Place
- Campinas, SP (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 16079051
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- INTERFEROMETERS; SEMICONDUCTOR LASERS; SURFACE PROPERTIES; SURFACES
- Descriptors DEC
- AMPLIFIERS; EQUIPMENT; LASERS; MEASURING INSTRUMENTS; SEMICONDUCTOR DEVICES; SOLID STATE LASERS
Optional Information
- Notes
- Published in summary form only.