Analytical transmission electron microscopy of nanostructured materials. Final report

The analytical transmission electron microscopy was used for the solution of very different problems in materials science. By means of this method the alloy formation of high silicon containing Cr-Ni-steels was investigated and characterized during the processes of mechanical alloying and hot isostatic pressing. The results brought about important conclusions concerning the constitution and structure of the system. The dispersoid formation, dispersion hardening and precipitation kinetics of newkind Cu-X-Y-alloys with outstanding mechanical and electrical properties could be explained and characterized. The analysis of amorphous diamond-like carbon layers created by new kind of laser controlled vacuum arc high rate deposition procedure provided informations on optimization of the properties of these layers. By variation of the ion incident angle the properties of the layers can be adjusted in the whole range between near diamond-like and near graphit-like ones. Contrary to the phase-diagram of the iron-aluminium-system we observed nanometer scale aluminium enrichments in the solid solution range. Materials with only 8 at% have a superlattice with the structure of the Fe3-Al-phase, which should be expected at aluminium concentrations of more than 18 at% only. (orig.)