There is a newer version of the record available.

Published May 2020 | Version v1
Journal article

Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys

  • 1. Ural Federal University (Russian Federation)
  • 2. PSC VSMPO-AVISMA Corporation (Russian Federation)

Description

The VST3331 titanium alloy in three structural states with different dispersities of the secondary α phase of titanium has been investigated by scanning electron microscopy and X-ray diffraction analysis. The possibility of using full-profile analysis of X-ray diffraction patterns for determining the size of titanium secondary α-phase crystallites has been estimated. It is demonstrated that the methods in use yield similar estimates of the average thickness of titanium secondary α-phase plates.

Additional details

Identifiers

Publishing Information

Journal Title
Crystallography Reports
Journal Volume
65
Journal Issue
3
Journal Page Range
p. 412-416
ISSN
1063-7745
CODEN
CYSTE3

Optional Information

Copyright
Copyright (c) 2020 © Pleiades Publishing, Inc. 2020