Rhenium ion beam for implantation into semiconductors
Creators
- 1. Institute for Theoretical and Experimental Physics, Moscow (Russian Federation)
- 2. National Research University of Electronic Technology ''MIET'', Moscow (Russian Federation)
- 3. National University of Science and Technology ''MISIS'', Moscow (Russian Federation)
Description
At the ion source test bench in Institute for Theoretical and Experimental Physics the program of ion source development for semiconductor industry is in progress. In framework of the program the Metal Vapor Vacuum Arc ion source for germanium and rhenium ion beam generation was developed and investigated. It was shown that at special conditions of ion beam implantation it is possible to fabricate not only homogenous layers of rhenium silicides solid solutions but also clusters of this compound with properties of quantum dots. At the present moment the compound is very interesting for semiconductor industry, especially for nanoelectronics and nanophotonics, but there is no very developed technology for production of nanostructures (for example quantum sized structures) with required parameters. The results of materials synthesis and exploration are presented.
Additional details
Identifiers
- DOI
- 10.1063/1.3673632;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 83
- Journal Issue
- 2
- Journal Page Range
- p. 02B913-02B913.3
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 14. international conference on ion sources
- Acronym
- ICIS 2011
- Dates
- 12-16 Sep 2011
- Place
- Giardini-Naxos, Sicily (Italy)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44041787
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GERMANIUM IONS; ION BEAMS; ION IMPLANTATION; ION SOURCES; QUANTUM DOTS; RHENIUM IONS; RHENIUM SILICIDES; SEMICONDUCTOR MATERIALS; SOLID SOLUTIONS; VACUUM COATING
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; DEPOSITION; DISPERSIONS; HOMOGENEOUS MIXTURES; IONS; MATERIALS; MIXTURES; NANOSTRUCTURES; REFRACTORY METAL COMPOUNDS; RHENIUM COMPOUNDS; SILICIDES; SILICON COMPOUNDS; SOLUTIONS; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2012 American Institute of Physics