Published 1990
| Version v1
Journal article
Combined field ion microscopy and transmission electron microscopy of heavy ion damage in tungsten
Description
A field ion microscopy (FIM) and transmission electron microscopy (TEM) investigation of radiation damage in tungsten after heavy ion bombardment has been carried out. Field ion specimens of tungsten were irradiated with 180-230 keV Xe+ ions. The irradiation doses were varied between 4 x 1011 and 4 x 1012 ions/cm2. The irradiated specimens were examined using FIM. Experiments combining both TEM and FIM were performed in order to compare the results obtainable by these two methods. The distribution of defects visible by TEM was inhomogeneous. The influence of the imaging field in FIM on the defects visible in TEM is discussed. (author)
Additional details
Publishing Information
- Journal Title
- Radiation Effects and Defects in Solids
- Journal Volume
- 115
- Journal Issue
- 1-3
- Series
- Radiat. Eff. Defects Solids.
- Journal Page Range
- 205-215
- CODEN
- REDSE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 22031135
- Subject category
- S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CRYSTAL DEFECTS; ION IMPLANTATION; ION MICROSCOPY; KEV RANGE 100-1000; PHYSICAL RADIATION EFFECTS; TRANSMISSION ELECTRON MICROSCO; TUNGSTEN; XENON IONS
- Descriptors DEC
- CHARGED PARTICLES; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; METALS; MICROSCOPY; RADIATION EFFECTS; TRANSITION ELEMENTS