Comparison of two semi-absolute methods. k₀-instrumental neutron activation analysis and fundamental parameter method X-ray fluorescence spectrometry for Ni-based alloys

Nickel based alloys play important role in nuclear, mechanical and chemical industry. Two semi-absolute standardless methods, k₀-instrumental neutron activation analysis (k₀-INAA) and fundamental parameter X-ray fluorescence spectrometry (FP-XRF) were used for the characterization of certified nickel based alloys. The optimized experimental conditions for NAA provided results for 18 and XRF for 15 elements. Both techniques were unable to quantify some important alloy making elements. However, both reported results of other elements as information values. The techniques were analyzed for their sensitivity and accuracy. Sensitivity was evaluated by the number of elements determined by each technique. Accuracy was ascertained by using the linear regression analysis and the average root mean squared error.