Published December 15, 2003 | Version v1
Journal article

A study on stimulated emission from erbium in silicon

Description

Prospects of stimulated emission from erbium in silicon have been analyzed by a Shockley-Read-Hall (SRH) model. A two-level system was considered for calculation of optical gain and the laser threshold. For an optical cavity of 300 μm with mirror reflectivities of 90% and an optimistic absorption coefficient of 5 cm-1, a population inversion of 1.4x1018 cm-3 was estimated as the threshold value. Achievement of the lasing condition was found feasible, but only for certain conditions of erbium activation. Non-radiative de-excitation routes were found to have strong influence on the erbium activity. On the assumption of 1019 cm-3 of optically active erbium sites with an overall spectral linewidth of 1 A, linear increase of optical power in the laser cavity has been estimated for injected carrier densities above 1018 cm-3

Additional details

Identifiers

DOI
10.1016/j.mseb.2003.08.033;
PII
S0921510703003878;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
105
Journal Issue
1-3
Journal Page Range
p. 146-149
ISSN
0921-5107
CODEN
MSBTEK

Conference

Title
Rare earth doped materials for photonics
Acronym
EMRS 2003 Symposium J
Dates
10-13 Jun 2003
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37044615
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; CARRIER DENSITY; DE-EXCITATION; ERBIUM; GAIN; LASER CAVITIES; POPULATION INVERSION; REFLECTIVITY; SILICON; STIMULATED EMISSION
Descriptors DEC
AMPLIFICATION; ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RARE EARTHS; SEMIMETALS; SORPTION; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.