Published May 30, 2003 | Version v1
Journal article Metadata-only

X-ray synchrotron study of liquid-vapor interfaces at short length scales: Effect of long-range forces and bending energies

Creators

  • 1. European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex (France)
  • 2. Laboratoire Leon Brillouin, CEA Saclay, F-91191 Gif-sur-Yvette Cedex (France)
  • 3. Service de Physique de l'Etat Condense, Orme des Merisiers, CEA Saclay, F-91191 Gif-sur-Yvette Cedex (France)
  • 4. Max-Planck Institut fuer Metallforschung, Heisenbergstrasse 1, D-70569 Stuttgart (Germany)
  • 5. LURE, Centre Universitaire Paris-sud, ba circumflex timent 209D, BP34, F-91898 Orsay cedex (France)

Description

We have investigated the small-scale structure of the liquid-vapor interface using synchrotron x-ray scattering for liquids with different molecular structures and interactions. The effective momentum-dependent surface energy first decreases from its macroscopic value due to the effect of long-range forces, and then increases with increasing wave vector. The results are analyzed using a recent density functional theory. The large wave-vector increase is attributed to a bending energy for which local and nonlocal contributions are equally important

Additional details

Identifiers

DOI
10.1103/PhysRevLett.90.216101;

Publishing Information

Journal Title
Physical Review Letters
Journal Volume
90
Journal Issue
21
Journal Page Range
p. 216101-216101.4
ISSN
0031-9007
CODEN
PRLTAO

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35046705
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
DENSITY FUNCTIONAL METHOD; INTERFACES; REFLECTION; SURFACE ENERGY; SURFACE TENSION; SYNCHROTRON RADIATION; X-RAY DIFFRACTION
Descriptors DEC
BREMSSTRAHLUNG; CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ENERGY; FREE ENERGY; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES; VARIATIONAL METHODS

Optional Information

Notes
(c) 2003 The American Physical Society