A new external microbeam system in Fudan University
Creators
- 1. Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433 (China)
Description
A cost-effective and removable external beam system is set up based on the Oxford Microbeam system in Fudan University. In our external beam system, 7.5-μm-thick Kapton film is used as exit window with a diameter of 3.5 mm. The spatial resolution is about 18 μm full width at half maximum (FWHM) on a copper grid. As an example, calcium distribution in otolith is present by the external micro-PIXE. In addition, little change can be done to the external system mentioned above for radiobiology experiments. The exit window can be changed from the focal plane to the observation window of vacuum chamber. By calculation, the beam spot size can reach less than 30 μm. Since the Oxford type octagonal target chamber is popular among the nuclear microprobe facilities, this method can be provided to easily replace the in-vacuum system with the external system, extending the in-vacuum analysis to external beam analysis
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2012.10.034Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2012.10.034;
- PII
- S0168-583X(12)00671-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 296
- Journal Page Range
- p. 82-86
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45065046
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAMS; CALCIUM; COPPER; FILMS; PIXE ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPATIAL RESOLUTION; TARGET CHAMBERS; VACUUM SYSTEMS; WINDOWS
- Descriptors DEC
- ACCELERATOR FACILITIES; ALKALINE EARTH METALS; CHEMICAL ANALYSIS; ELEMENTS; METALS; NONDESTRUCTIVE ANALYSIS; OPENINGS; RESOLUTION; SPECTROSCOPY; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.