Published February 2011 | Version v1
Journal article Metadata-only

Beam profile rapid-evaluation of heavy-ion micro-beam in the atmosphere using improved etching method for CR-39 and semi-automatic image analysis

Creators

  • 1. Japan Atomic Energy Agency, Quantum Beam Science Directorate, Takasaki, Gunma (Japan)
  • 2. Japan Atomic Energy Agency, Takasaki Advanced Radiation Research Inst., Takasaki, Gunma (Japan)

Description

To achieve the rapid-evaluation of heavy-ion microbeam profile in the atmosphere, we investigated the improved etching method of CR-39 and semi-sutomatic image analysis. These processes could be reduced down to only one-twelfth and one-thirtieth of that of the conventional method, respectively. Also, the beam-profile was simulated by the SRIM software. These facts made it sure that this present method was worth enough for the rapid-evaluation. (author)

Availability note (English)

Available from http://dx.doi.org/10.3769/radioisotopes.60.47

Additional details

Identifiers

DOI
10.3769/radioisotopes.60.47;

Publishing Information

Journal Title
Radioisotopes (Tokyo)
Journal Volume
60
Journal Issue
2
Journal Page Range
p. 47-53
ISSN
0033-8303

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
42102403
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ARGON 40 BEAMS; BEAM FOCUSING MAGNETS; CARBON 12 BEAMS; ETCHING; IMAGE PROCESSING; ION BEAM INJECTION; LOCAL IRRADIATION; MEV RANGE 10-100; MONTE CARLO METHOD; NEON 20 BEAMS; POSITIONING; SILICON NITRIDES
Descriptors DEC
BEAM INJECTION; BEAMS; CALCULATION METHODS; ENERGY RANGE; EQUIPMENT; ION BEAMS; IRRADIATION; MAGNETS; MEV RANGE; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; PROCESSING; SILICON COMPOUNDS; SURFACE FINISHING

Optional Information

Notes
10 refs., 7 figs., 1 tab.