Analysis of Fourier ptychographic microscopy with half of the captured images
Creators
- 1. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800 (China)
Description
Fourier ptychographic microscopy (FPM) is a new computational imaging technique that can provide gigapixel images with both a high-resolution and a wide field of view. However, the data-acquisition process is time-consuming, which is a critical issue. In this study, we analyze the FPM imaging system with the half number of captured images; i.e. if the size of the light-emitting diode (LED) array is 15 × 15, we use 15 × 8 LEDs to capture images. According to the image analysis of the conventional FPM system, we then compare the reconstructed images with different captured data. When the sample is close to amplitude-only, simulation and experimental results show that the resolution of the reconstructed image with the half number of captured data does not differ significantly from that with all the captured data. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2040-8986/aad453Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Optics (Online)
- Journal Volume
- 20
- Journal Issue
- 9
- Journal Page Range
- [7 p.]
- ISSN
- 2040-8986
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52023479
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMPLITUDES; CAPTURE; DATA ACQUISITION; FOURIER TRANSFORMATION; IMAGE PROCESSING; IMAGES; LIGHT EMITTING DIODES; MICROSCOPY; RESOLUTION; SIMULATION
- Descriptors DEC
- DATA PROCESSING; INTEGRAL TRANSFORMATIONS; PROCESSING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TRANSFORMATIONS