Pawley and Rietveld refinements using electron diffraction from L12-type intermetallic Au3Fe1-x nanocrystals during their in-situ order-disorder transition
- 1. Microscopy and Imaging Center, and Materials Science and Engineering Program, Texas A and M University, College Station, TX 77843-2257 (United States)
- 2. Department of Chemistry, Texas A and M University, College Station, TX 77843 (United States)
- 3. Department of Chemistry and Materials Research Institute, The Pennsylvania State University, University Park, PA 16802 (United States)
Description
During the in-situ order-disorder transition of intermetallic L12-type Au3Fe1-x nanocrystals, structural information has been retrieved from their electron diffraction patterns based on the Pawley refinement that is unrelated to the electron kinematical or dynamical scattering nature as well as the Rietveld refinement using a kinematical approximation. At room temperature, it was found that the nanocrystals contain approximately x=40% vacancies at the Fe site. Based on in-situ heating this phase displayed an irreversible order-disorder transition, with the transition temperature between 553 and 593 K. A sudden increase in lattice parameter was detected during the first heating from the ordered phase, while the second heating of the disordered phase showed only a linear relationship with temperature. From the lattice parameter measurement of the disordered phase, the coefficient of thermal expansion was estimated as 1.462x10-5 K-1. The long-range order parameter S was determined by the refined site occupancies, as well as the integrated intensities of the superlattice (1 0 0) and fundamental (2 2 0) reflections using the Pawley and Rietveld refinements during the order-disorder transition. Considering the dynamical scattering effect, Blackman two-beam approximation theory was applied to corrected S, which slightly attenuated after the correction. A comparison of the electron diffraction with X-ray diffraction data was made. It was demonstrated that elemental and structural information could be retrieved through quantitative electron diffraction studies of the nanomaterials. Since the Pawley refinement algorithm does not include the electron scattering event, it is especially useful to refine the electron diffraction data regardless of the sample thickness. -- Highlights: → Pawley refinement was applied to refine electron diffraction data. → The first study of an order-disorder transition of nanoparticles using in-situ quantitative electron diffraction. → Determination of the long-range order parameter S using electron diffraction based on the refinement. → Expansion on the ability of using TEM data to retrieve additional structural and elemental information.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2011.04.003Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2011.04.003;
- PII
- S0304-3991(11)00153-7;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 111
- Journal Issue
- 8
- Journal Page Range
- p. 1295-1304
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45025439
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; APPROXIMATIONS; COMPARATIVE EVALUATIONS; ELECTRON DIFFRACTION; GOLD; HEATING; INTERMETALLIC COMPOUNDS; IRON; LATTICE PARAMETERS; NANOSTRUCTURES; ORDER PARAMETERS; ORDER-DISORDER TRANSFORMATIONS; SUPERLATTICES; THERMAL EXPANSION; TRANSITION TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRON MICROSCOPY; ELEMENTS; EVALUATION; EXPANSION; MATHEMATICAL LOGIC; METALS; MICROSCOPY; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SCATTERING; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.