Incorporation of QD ensembles in separate confinement heterostructures for long wavelength emission
- 1. Institute of Solid State Physics, Semiconductor Epitaxy, University of Bremen (Germany)
Description
This paper deals with the incorporation of temperature-sensitive InGaN quantum dot (QD) ensembles into separate confinement double heterostructures grown on free-standing GaN substrates. The laser diode (LD) structures were processed as ridge waveguide devices. The emission wavelength in electroluminescence (EL) of the 3 fold QD layers is around 485 nm. The structural quality and state of strain of the layers has been determined by high resolution X-ray diffraction (HRXRD) measurements. Current-voltage characteristics, light output power measurements and EL-spectra demonstrate the good stability of the device. A comparable small blue shift was observed with increasing excitation current (copyright 2009 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssc.200880986Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. C, Current Topics in Solid State Physics (Print)
- Journal Volume
- 6
- Journal Issue
- Suppl.2
- Journal Page Range
- p. S921-S924
- ISSN
- 1862-6351
Conference
- Title
- International workshop in nitride semiconductors (IWN 2008)
- Dates
- 6-10 Oct 2008
- Place
- Montreux (Switzerland)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 40070426
- Subject category
- S36: MATERIALS SCIENCE; S30: DIRECT ENERGY CONVERSION;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; ELECTROLUMINESCENCE; EMISSION SPECTRA; GALLIUM NITRIDES; HETEROJUNCTIONS; INDIUM NITRIDES; LAYERS; LIGHT EMITTING DIODES; POWER; QUANTUM DOTS; SEMICONDUCTOR LASERS; SPECTRAL SHIFT; STABILITY; STRAINS; SUBSTRATES; TEMPERATURE DEPENDENCE; VISIBLE RADIATION; VISIBLE SPECTRA; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; EMISSION; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; LASERS; LUMINESCENCE; NANOSTRUCTURES; NITRIDES; NITROGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; PNICTIDES; RADIATIONS; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SOLID STATE LASERS; SPECTRA
Optional Information
- Notes
- With 4 figs., 0 tabs., 13 refs.; SICI: 1862-6351(200906)6:5+<::AID-PSSC200880986>3.0.TX;2-U