Published September 1985
| Version v1
Journal article
Evaluation of metal rhin-film to oxide adhesion for layered analysis of interface using SIMS technique
Description
Indium film-oxide glass interface is investigated with SIMS technique, and indium film to substrate adhesion with pull test. The interconnection between the increase of adhesion, being activised, and the form of the indium secondary ions current disctribution curve is determined
Additional details
Additional titles
- Original title (Russian)
- Оценка адгезии тонких металлических пленок к окислам при послойном анализе границы раздела методом VIMS
Publishing Information
- Journal Title
- Poverkhn.: Fiz., Khim., Mekh.
- Journal Issue
- no.10
- Series
- Poverkhn.: Fiz., Khim., Mekh.
- CODEN
- PFKMD
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 17035409
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADHESION; ARGON IONS; BOROSILICATE GLASS; DEPTH; ELECTRIC CURRENTS; FILMS; INDIUM; INDIUM IONS; ION BEAMS; ION EMISSION; MASS SPECTROSCOPY; PHYSICAL RADIATION EFFECTS; SPRAYED COATINGS; SUBSTRATES; VAPOR DEPOSITED COATINGS
- Descriptors DEC
- ATOMIC IONS; BEAMS; CHARGED PARTICLES; COATINGS; CURRENTS; DIMENSIONS; ELEMENTS; EMISSION; GLASS; IONS; METALS; RADIATION EFFECTS; SPECTROSCOPY