Published November 2002 | Version v1
Journal article Metadata-only

Total reflection X-ray fluorescence analysis

Creators

  • 1. China Academy of Engineering Physics, Mianyang (China)

Description

The radical principle, equipment and peculiarity of total reflection X ray fluorescence are summarized. Application and perspective of total reflection X ray fluorescence are recommended

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
22
Journal Issue
6
Journal Page Range
p. 572-575
ISSN
0258-0934

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
34032765
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
FORECASTING; PERFORMANCE; REFLECTION; USES; X-RAY FLUORESCENCE ANALYSIS; X-RAY FLUORESCENCE ANALYZERS
Descriptors DEC
CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS