Published April 2006 | Version v1
Journal article

In situ luminescence as monitor of radiation damage under swift heavy ion irradiation

  • 1. Joint Institute for Nuclear Research, Dubna (Russian Federation)
  • 2. Cyclotron Centre of the Slovak Republic, Slovak Office of Standards Metrology and Testing, Bratislava (Slovakia)
  • 3. Shubnikov Institute of Crystallography, RAS, Moscow (Russian Federation)

Description

In this paper, we discuss the results of recent ionoluminescence experiments concerning the study of radiation dose effects in α-Al2O3, α-Al2O3:Cr and LiF crystals under the irradiation with different swift heavy ions in a wide range of nuclear and electronic stopping powers. To monitor the lattice disorder in alumina and lithium fluoride, the luminescence of F-type centres have been used. It was shown that the degradation stage of the F+ centre luminescence signal under 710MeV Bi ion irradiation begins at a very low damage level and cannot be induced by defects produced by elastic collisions. The observed difference in the evolution of F3+-centre luminescence in LiF by swift heavy ions and conventional radiation is ascribed to the high local concentration of defects in the ion-track region. In experiments with ruby, we explored a well-known piezospectroscopic method for in situ monitoring of the build up and accumulation of mechanical stress under the irradiation with high-energy heavy ion. The obtained data strongly imply that the lattice disorder induced by collective electronic excitations plays a dominant role in generation of mechanical stress in the studied fluence range

Additional details

Identifiers

DOI
10.1016/j.nimb.2005.11.100;
PII
S0168-583X(05)02037-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
245
Journal Issue
1
Journal Page Range
p. 194-200
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
6. international symposium on swift heavy ions in matter
Acronym
SHIM 2005
Dates
28-31 May 2005
Place
Aschaffenburg (Germany)

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.