Development and performance test of picosecond pulse x-ray excited streak camera system for scintillator characterization

To observe time and wavelength-resolved scintillation events, picosecond pulse X-ray excited streak camera system is developed. The wavelength range spreads from vacuum ultraviolet (VUV) to near infrared region (110-900 nm) and the instrumental response function is around 80 ps. This work describes the principle of the newly developed instrument and the first performance test using BaF2 single crystal scintillator. Core valence luminescence of BaF2 peaking around 190 and 220 nm is clearly detected by our system, and the decay time turned out to be of 0.7 ns. These results are consistent with literature and confirm that our system properly works. (author)