Published August 1986
| Version v1
Journal article
Contactless measurement of carrier mobility and concentration in semiconductors
Creators
- 1. Institute of Semiconductor Physics Lithuanian SSR Acad. of Sci, Vilnius
Description
It is shown that localization of excitation and reception of radio-frequency helicon waves allows error to be reduced to +/-5%. In the measurement of carrier mobility and concentration, the range of measurable carrier concentrations is 1021-1025m-3. When laboratory magnets with a field of ca 1-2 T are used, carrier mobility greater than 0.5-1 m2V-1 sec-1 can be measured
Additional details
Publishing Information
- Journal Title
- Instrum. Exp. Tech. (Engl. Transl.)
- Journal Volume
- 29
- Journal Issue
- 1
- Series
- Instrum. Exp. Tech. (Engl. Transl.).
- Journal Page Range
- 213-215
- ISSN
- 0020-4412
- CODEN
- INETA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18027200
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACCURACY; ANTIMONY ALLOYS; CARRIER DENSITY; CARRIER MOBILITY; HELICON RESONANCE; HELICON WAVES; INDIUM ALLOYS; MAGNETIC FIELDS; MAGNETIC PROBES; PERFORMANCE TESTING; PLASMA DIAGNOSTICS; RADIOWAVE RADIATION; SEMICONDUCTOR MATERIALS; SOLID-STATE PLASMA; SPECIFICATIONS; WAVE PROPAGATION
- Descriptors DEC
- ALLOYS; ELECTROMAGNETIC RADIATION; MATERIALS; MOBILITY; PLASMA; PROBES; RADIATIONS; RESONANCE; TESTING
Optional Information
- Notes
- Cover-to-cover translation of Pribory i Tekhnika Ehksperimenta (USSR).